Detalhe da pesquisa
1.
Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.
Anal Chem
; 85(10): 5064-70, 2013 May 21.
Artigo
em Inglês
| MEDLINE | ID: mdl-23590425
2.
Surface analysis using a new plasma assisted desorption/ionisation source for mass spectrometry in ambient air.
Rev Sci Instrum
; 83(6): 063503, 2012 Jun.
Artigo
em Inglês
| MEDLINE | ID: mdl-22755623